xD Reflect at CIE 2015

xD Reflect project results were presented at CIE 2015

The 28th Session of the CIE took place in Manchester, United Kingdom, June 28 – July 4, 2015. Visit the event website for more details.

Oral presentation: MEASUREMENT OF GONIOFLUORESCENCE IN PHOTOLUMINISCENT MATERIALS, A. Ferrero et al.  (ID 177).

Poster presentation: MEASURING SPARKLE OF EFFECT COATINGS, A. Ferrero and S. Bayón (ID 259)

Oral presentation: INVESTIGATION OF THE INTER-INSTRUMENT AGREEMENT OF SPECULAR GLOSSMETERS,  Leloup F. B., Audenaert J., Hanselaer P. – Session OS10 – Characterization of the optical and visual properties of materials, on Wednesday July 1st

Oral presentation: CHARACTERIZATIONS OF SPECULAR PEAKS FROM A METROLOGICAL GLOSS SCALE,  Ged, G., Flys, O., Silvestri, Z., Källberg, S.,Tayeb-Chandoul, F., Le Breton, R., Himbert, M.E., Obein, G. , – Session OS10 Characterization of the optical and visual properties of materials, on Wednesday July 1st, (presentation OP38)

Poster presentation: OUT OF PLANE BRDF MEASUREMENT AT LNE-CNAM USING     “CONDOR”, OUR PRIMARY GONIOSPECTROPHOTOMETER,    Le Breton R., Ged G., Obein G. – poster  session PO2 (Wednesday, 14:00-15:30) with poster number PO2-23